Integrated Circuit Metrology, Inspection, and Process Control V - $50 (palo alto)

Integrated Circuit Metrology, Inspection, and Process Control V 1

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Integrated Circuit Metrology, Inspection, and Process Control V
March 4-5, 1991, San Jose, California
William H. Arnold, Ed.
SPIE Proceedings Volume 1464
Publication date: ‎ June 1, 1991

ISBN-10‏: ‎ 0819405639
ISBN-13‏: ‎ 978-0819405630

Very clean inside. Slight bruising on the front cover.

post id: 7886761906

posted: 2025-10-06 16:16

updated: 2026-01-22 20:59

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Integrated Circuit Metrology, Inspection, and Process Control V -...